{"id":4490,"date":"2017-10-13T11:43:20","date_gmt":"2017-10-13T09:43:20","guid":{"rendered":"http:\/\/test.jonas-redmann.at\/geschaeftsfelder\/photovoltaik\/wis\/"},"modified":"2021-05-19T11:23:04","modified_gmt":"2021-05-19T09:23:04","slug":"wis","status":"publish","type":"page","link":"https:\/\/www.jonas-redmann.com\/en\/geschaeftsfelder\/photovoltaik\/wis\/","title":{"rendered":"WIS"},"content":{"rendered":"

[vc_row][vc_column][vc_column_text css=”.vc_custom_1519374570569{margin-bottom: 20px !important;}”]<\/p>\n

W<\/strong>afer I<\/strong>nspection S<\/strong>ystem<\/span><\/h1>\n

[\/vc_column_text][vc_empty_space height=”14px” css=”.vc_custom_1621416080387{margin-bottom: 20px !important;background-image: url(https:\/\/www.jonas-redmann.com\/wp-content\/uploads\/2017\/04\/stripes_rot_dick.gif?id=681) !important;background-position: 0 0 !important;background-repeat: repeat !important;}”][vc_column_text]In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.<\/span><\/span>[\/vc_column_text][vc_single_image image=”1532″ img_size=”full” el_class=”img-full”][vc_column_text el_class=”uk-text-justify” css=”.vc_custom_1517840366384{margin-bottom: 0px !important;}”]<\/p>\n

WIS Configuration<\/span><\/h3>\n

[\/vc_column_text][vc_empty_space height=”14px” css=”.vc_custom_1513162710540{margin-top: 14px !important;margin-bottom: 14px !important;background-image: url(https:\/\/www.jonas-redmann.com\/wp-content\/uploads\/2017\/04\/stripes_rot_dick.gif?id=681) !important;background-position: 0 0 !important;background-repeat: repeat !important;}”][vc_column_text]Our Wafer Inspection System \u2013 WIS – carries out a fully automated inspection of mono- and polycrystalline silicon wafers. The modular design of the system means that individual configuration with the latest inspection technologies as well as smooth integration into your product lines are possible.<\/p>\n

The systems can achieve an average throughput of up to 3600 wafers per hour with the lowest failure rates. Like all of our systems, the WIS boasts outstanding material and manufacturing quality as well as easy maintenance and user friendliness.<\/p>\n

The system can be connected to your Manufacturing Execution System (MES) and to your fully automated transport and storage system.[\/vc_column_text][vc_column_text el_class=”uk-text-justify” css=”.vc_custom_1517835094438{margin-bottom: 0px !important;}”]<\/p>\n

Technical Data and Features<\/span><\/h3>\n

[\/vc_column_text][vc_empty_space height=”14px” css=”.vc_custom_1513162710540{margin-top: 14px !important;margin-bottom: 14px !important;background-image: url(https:\/\/www.jonas-redmann.com\/wp-content\/uploads\/2017\/04\/stripes_rot_dick.gif?id=681) !important;background-position: 0 0 !important;background-repeat: repeat !important;}”][vc_column_text el_class=”uk-text-justify”]Separation of wafer from wafer stack<\/span><\/p>\n

Configurable measuring module through integration of up to three inspection systems<\/span><\/p>\n

Loading of chemical carrier<\/span><\/p>\n

Optimum combination of automation and inspection (stop and go and on-the-fly)<\/span>[\/vc_column_text][vc_column_text el_class=”uk-text-justify” css=”.vc_custom_1517835370056{margin-bottom: 0px !important;}”]<\/p>\n

Options<\/span><\/h3>\n

[\/vc_column_text][vc_empty_space height=”14px” css=”.vc_custom_1513162710540{margin-top: 14px !important;margin-bottom: 14px !important;background-image: url(https:\/\/www.jonas-redmann.com\/wp-content\/uploads\/2017\/04\/stripes_rot_dick.gif?id=681) !important;background-position: 0 0 !important;background-repeat: repeat !important;}”][vc_column_text]MES SECS \/ GEM PV2<\/span><\/p>\n

Inspection of up to three quality features: \u00a0geometry, thickness\/ TTV, micro-crack and lifetime<\/span><\/p>\n

Interlinking with automated Transport and Storage System<\/span><\/p>\n

direct connection to Wet Bench Loader<\/span>[\/vc_column_text][vc_column_text]\n\n

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